Thermal Analysis Microscope System (TAM)    Understanding the thermal performance of advanced materials is a key R&D objective in many industries including Aerospace, Defense, Propulsion, Energy, Catalysts, Consumer Products, and Electronics. In support of this need, QUEST has developed the Thermal Analysis Microscope (TAM) System. The TAM allows scientists and engineers to explore material behavior at actual operating temperatures, on a microscopic scale. Some applications include crack detection and length measurement, thermal conductivity measurement in single and multi-layer materials, debond detection, absolute temperature and thermal gradient measurement, and temperature induced shape change measurement.  More...